Bibliografia
1
Bibliografia
Capitolo 1
1. BASIC MECHANISMS FOR SINGLE-EVENT EFFECTS. Dodd, Paul E. Albuquerque, New Mexico : Sandia National Laboratories.
2. SYSTEM LEVEL MITIGATION STRATEGIES. Heidergott, William F. s.l. : ESA, 2008.
3. Cosmic and terrestrial single-event radiation effects in dynamic random access memories. L., Massengill. s.l. : IEEE Trans. Nucl. Sci.
4. A new failure mode of radiation-induced soft errors in dynamic memories.
Rajeevakumar, T. V. e Liu, N. C. s.l. : IEEE Electron Dev. Lett., 1988.
5. Memory SEU simulations using 2-D transport calculations. Axness, Weaver. s.l. : IEEE Electron Device Lett, 1985.
6. http://www2.electronicproducts.com/NAND_vs_NOR_flash_technology-article-FEBMSY1-feb2002-html.aspx. [Online] 2002.
7. SEE and TID of Emerging Non-Volatile Memories. D.N. Nguyen, L.Z. Scheick. Pasadena, California : Jet Propulsion Laboratory.
8. COLLECTION OF CHARGE ON JUNCTION NODES FROM ION TRACKS.
Messenger, G. C. s.l. : IEEE, 1982.
9. Digital Latch Up and functional protection for COTS memories in space. s.l. : ESA, 2009.
10. Radiation-induced soft errors in advanced semiconductor technologies. Baumann. s.l. : IEEE, 2005.
11. Compendium of Single Event Effects Results for NASA. Martha V., Christian
Poivey, Scott D. Kniffin. Ponte Vedra Beach, Florida : s.n., 2006.
12. TID and SEE Response of an Advanced Samsung 4G NAND Flash Memory. T.R.
Oldham, M. Friendlich, J.W. Howard.
Bibliografia
2
Capitolo 2
1. Niesi, Gianfranco. Università di Genova, Dip. di Matematica. [Online] 2009. http://www.dima.unige.it/~niesi/TdC/TdC.html.
2. Morelos-Zaragoza, Robert H. The art of error correcting coding. s.l. : John Wiley & Sons, 2002.
3. Pretzel, Oliver. Error-Correcting Codes and Finite Fields. Oxford : Clarendon Press, 1992.
4. Lin, Shu e Costello, Daniel. Error Correcting Coding: Fundamentals and Applications. s.l. : Prentice-Hall, 1983.
5. Kazakov, P. Fast Calculation of the number of minimum-weight words of CRC codes. s.l. : IEEE Trans. Info. Theory, 2001.
6. Univ. Padova dip. Ing. dell'Informazione. Università di Padova dipartimento di
Ingneria dell'Informazione. [Online]
www.dei.unipd.it/wdyn/?IDfile=2602&IDsezione=3565.
7. FINITE FIELD CALCULATOR AND REED-SOLOMON SIMULATOR . http://ect.bell-labs.com/who/emina/applets/FFCalc.html. [Online] http://ect.bell-labs.com/who/emina/applets/FFCalc.html.
8. Wicker, Stephen e Bhargava, Vijay. Reed-Solomon Codes and their applications. s.l. : IEEE PRESS, 1994.
9. Vasic, Erozan M. Kurtas-Bane. Advanced Error Control Techniques for data storage systems. s.l. : Taylor & Francis Group, 2006.
10. Efficient Majority Logic Fault Detection with Difference-Set Codes for Memory Applications. Liu, Shih Fu, Reviriego, Pedro e Maestro, Juan Antonio. s.l. : IEEE.
Capitolo 3
1. Efficient Majority Logic Fault Detection with Difference-Set Codes for Memory Applications. Liu, Shih Fu, Reviriego, Pedro e Maestro, Juan Antonio. s.l. : IEEE. 2. Lin, Shu e Costello, Daniel. Error Correcting Coding: Fundamentals and Applications. s.l. : Prentice-Hall, 1983.
Bibliografia
3
3. Fast Low Complexity Reed Solomon Codec for Space and Avionics Ramdisk Applications. M.S. Hodgart, H.A.B. Tiggeler. Guildford, Surrey (UK) : University of Surrey.
4. Morelos-Zaragoza, Robert H. The art of error correcting coding. s.l. : John Wiley & Sons, 2002.
5. Vasic, Erozan M. Kurtas-Bane. Advanced Error Control Techniques for data storage systems. s.l. : Taylor & Francis Group, 2006.
6. Kazakov, P. Fast Calculation of the number of minimum-weight words of CRC codes. s.l. : IEEE Trans. Info. Theory, 2001.
