The laboratories dedicated to students of the Master degree program in Physics are located in the Ricamo and De Meis buildings of UNIVAQ Polo Didattico di Coppito, see map below. All laboratories are equipped with access for disabled people and LAN and Wi-‐Fi connection.
Labs N°
work place
Building Floor Equipment
Advanced Physics Lab:
Condensed Matter Physics
5 Ricamo Basement -‐ Monochromator DK480 with CCD XGA 12 bit IIDC with open source data acquisition system
-‐ Microscope with CCD XGA 12 bit IIDC with open source data acquisition system to track Brownian particle motion -‐ Automatic system to measure viscoelastic properties in infra-‐HZ range.
-‐ Photoemission (XPS, UPS) -‐ Electronic microscope
Advanced Physics Lab: Particle and astroparticle Physics
5 Ricamo Basement Work spots with
-‐ organic and inorganic scintillator, photomultipliers;
-‐ set of gamma sources;
-‐ PC and acquisition systems (CAMAC and MCA boards);
-‐ nuclear electronics (crates, amplifiers, HV suppliers, logical functions, NIM e CAMAC.
Advanced Physics Lab: Physics of the atmosphere
5 De Meis Ground -‐ O3 and N-‐oxides analysers (UV e fluorescence) -‐ multichannel spectrometer
-‐ vacuum pump (sampling and measurement)
-‐ alpha Particle Counter to measure radon in atmosphere -‐ Sensors for relative temperature, pressure, humidity -‐ optical set up with laser, lenses system, to detect sulphates in rain
-‐ seismic sensors, signal amplifiers and data acquisition -‐ Digital Oscilloscope and signal generators, photodiodes and multimeters for measurements of 6 PC
Advanced Physics
Lab: Space Physics 5 Ricamo Basement 3 set ups equipped with:
oscilloscope, signal generators, boards for Analogic/Digital conversion, PC with MATLAB/LABVIEW software, magnetometer fluxgate, antenna VLF, Helmholtz coils.
Computer Lab. 30 Ricamo First 23 work-‐spots thin client connected to 2 servers (Windows e Linux)
Nanotechnologies
Lab. 5 Ricamo Basement -‐Photoemission X (XPS)
-‐ X-‐ray Diffractometer for bulk solids and thin films (XRD e GI-‐
XRD)
-‐ X-‐Reflectometry X (XRR)
-‐ Scanning Electronic Microscope (SEM) -‐ Atomic Force Microscopy (AFM) -‐ Set ups for electric measurements (I/V) -‐ Set ups for photocurrent measurements
