1 Luca Gavioli
Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) &
Dipartimento di Matematica e Fisica, Università Cattolica del Sacro Cuore Via dei Musei 41, I-25121 Brescia, Italy
Metodi sperimentali della fisica moderna
• Class organization (official)
• Lectures (48 hours)
• lab work (48 hours)
lab work: groups of 2-3 people working on a specific research subject proposed by lab leaders.
Final report on the experimental work that will be discussed individually at the oral exam
Exam:
• Individual discussion of the report
• 2 questions on the course program luca.gavioli@.unicatt.it
www.dmf.unicatt.it/nano
http://docenti.unicatt.it/ita/luca_gavioli/
Tel: 030 2406 723
2
• Pumps, gauges
• Gas kinetics, electron/gas interaction
• Mass Spectrometry
OUTLINE
VACUUM
ELECTRON ANALIZERS
• RFA
• CMA
• CHA
• Intro
• Fermi level
• p-n Junctions
• Diode equation
P-N JUNCTIONS
ATOMIC FORCE MICROSCOPY
• Operating principle
• Force-distance curves
• Operating modes
SCANNING ELECTRON MICROSCOPY
• Description
• beam-sample interaction
• Image formation
3
• Knowledge and understanding of how to make vacuum
• Ability to distinguish molecules
AIM
VACUUM
ELECTRON ANALYZERS
• Knowledge and understanding of how to distinguish electrons
• Knowledge and
understanding of how to measure surface topography
• Knowledge and understanding of the physics at the base of a junction
P-N JUNCTIONS
ATOMIC FORCE MICROSCOPY
SCANNING ELECTRON MICROSCOPY
• Knowledge and
understanding of what information is coming from an «image»
4
• Modern Vacuum Physics, David S. Betts (Ed), CHAPMAN & HALL/CRC (pdf)
• Introduzione alla tecnologia del vuoto, B.
Ferrario, Patron Ed. (pdf)
• Foundations of Vacuum Science and Technology, Lafferty, J. M.; Wiley & Sons (pdf)
• Handbook of Vacuum Science and Technology, D. Hoffman, B. Singh, J.H.
Thomas, Academic Press
References
VACUUM ELECTRON ANALIZERS
AFM-SEM P-N JUNCTIONS
• Physics of Semiconductor Devices, S.M.
Sze, Wiley (pdf)
• Solid State Physics, Pastori Parravicini, Chap. 13-14 (pdf)
• Atomic, Molecular and Optical Physics : Charged Particles, F.B. Dunning, R.G. Hulet, Academic Press (Ch. 6) Electron Energy Analysers , J.L.
Erskine (pdf)
• Modern techniques of surface science, D.P.
Woodruff, T.A. Delchar, Cambridge. (Ch. 1,2)
• Methods of surface analysis (Ch. 3), M.P. Shea, Cambridge (pdf)
• Rev. Sci. Instrum. 39, 33 (1968); Rev. Sci.
Instrum. 38, 1210 (1967); Phys. Rev. 54 818 (1938)
PLEASE NOTE: the slides provided are NOT sufficient to pass the exam
• Scanning Probe Microscopies: Atomic Scale Engineering by Forces and Currents
• NT-MDT slides
• B. Cappella, G. Dietler, Surface Science Reports 34 (1999) 1-104
• Goldstein, Scanning Electron Microscopy and X-ray Microanalysis (Ch. 1-8)
