Nonlinear Modeling of Si/SiGe HBT Using ANN

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HBTs using an Artificial Neural Network (ANN). The ANN is used to model the DC non-linearities of the intrinsic device. In this way, physical phenomena such as nonideal leakage currents and the Kirk effect can be modeled without time-consuming extraction. Capacitive nonlinearities are modeled by the well-known relationship between the capacitance and the junction voltage, ignoring the diffusion capacitance. By comparing ANN model results to measurements, we show that a good agreement for DC and nonlinear characteristics is obtained.

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