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BIBLIOGRAFIA 80

Bibliografia

[1] Venturi Leonardo, Studio e progettazione di un sistema automatico per

l'acquisizione di immagini di lastre in materiale lapideo, Tesi di laurea, Università di Pisa 2004-03-01

[2] P. Primavori, I trattamenti superficiali delle pietre ornamentali (parte prima),

Marmomacchine, A. 28 n. 143 (5 bimestre 1998)

[3] P. Primavori, I trattamenti superficiali delle pietre ornamentali (parte seconda),

Marmomacchine, A. 28 n. 144 (6 bimestre 1998)

[4] Dino Gnesotto, La lucidatura del marmo, Marmomacchine, A. 22 n. 106 (4

bimestre 1992)

[5] Dino Gnesotto, “5 extra”: l’utensile per la lucidatura del marmo,

Marmomacchine, A. 23 n. 112 (4 bimestre 1993) pag 156-157

[6] Manbir S. Sodhi end Khalil Tiliouine, 1995, Surface roughness monitoring

using computer vision, Pergamon vol.37 no.7, pp. 817-828.

[7] A. Taguchi, T. Miyoshi, Y. Takaya, S. Takahashi, K. Saito , 2000, 3D

Micro-profile measurement using optical inverse scattering phase method , Annals of the CIRP, Vol 49/1/2000.

[8] P. Lehmann, G. Goch, 2000, Comparison of conventional light scattering and

speckle techniques concerning an in-process characterisation of engineered surfaces, Annals of the CIRP Vol. 49/1/2000.

[9] T. Miyoshi, S. Takahashi, Y. Takaya, S. Shimada, Higt sensitivity optical

detection of oriented microdefects on silicon wafer surfaces using annular illumination, Annuals of the CIRP Vol 50/1/2001.

[10] H. Schwenke, U. Neuschaefer-Rube, T. Pfeifer, H. Kunzmann, Optical

methods for dimensional metrology in production engineering, Annuals of the CIRP 51/2/2002.

[11] A.A.G. Bruzzone, J.S. Montanaro, A. Ferrando, P.M. Lonardo, Wavelet

analysis for surface characterisation: an experimental assessment, Annuals of tha CIRP, Vol. 53/1/2004.

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BIBLIOGRAFIA 81

[12] D.K. Bowen, M. Wormington, Measurement of surface roughnesses and

topography at nanometer levels by diffuse x-ray scattering, Annuals of the CIRP, Vol. 43/1/1994.

[13] Gert Goch, Raimund Volk, Horst Kunzmann, Contactless surface

measurement with a new acoustic sensor, Annuals of the CIRP Vol. 43/1/1994. [14] Brodmann R., Gast Th., An optical instrument for measuring the surface

roughness in production control, Annals CIRP 33/1 (1984) 403-406.

[15] Gael Obein, Kenneth Knoblaugh, Francoise Vienot, Difference scaling of

gloss: Nonlinearity, binocularity, and constancy, 2004, Lournal of Vision vol. 4, pp 711-720.

[16] Normativa ASTM D 532-89 (Reapproved 1999), Standard Test Method for

Specular Gloss.

[17] Zbigniew Otremba, 2004, Modelling the bidirectional reflectance distribution

function (BRDF) of seawater polluted by an oil film, Optics Express vol 12 n.8, pp. 1671-1676.

[18] D. Rod White, Peter Saunders, Stuart J. Bonsey, John van de Ven, and Hamish Edgar, 1998, Reflectometer for measuring the bidirectional reflectance

of rough surfaces, Applied Optics vol. 37, No. 16, pp. 3450-3454.

[19] Zack Waters, 2003, Acquiring Parameters for Rendering, Computer Science,

Workcester Polytechnic Istitute.

[20] Angelica Frisa Morandini, 2005, Guida alla marcatura CE nel settore lapideo,

stampa non in versione finale, Internazionale marmi macchine Carrara.

[21] Normativa EN ISO 2813-(Determinazione della brillantezza speculare di film di

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BIBLIOGRAFIA 82

SITI INTERNET

Processo di lavorazione delle lastre di marmo

http://www.marbleandmore.com/marketplace/DETTAGLI.asp?IDART=2485&TIP O=Vetrina http://www.dalforno.com/ita/ventose/ventose.htm http://www.ataventose.it/marmoi.html http://www.donatoni.it/products-it.php?lng=1&mrif=4 http://www.breton.it/dynamic/it/catalogo/catalogo.php?idg=4 http://leader.artigianinet.com/APPROVATI/CERTIFICAZIONI/MARMO/dw_24_1 208_2944.html http://www.vacanzeinversilia.com/escavazione.html http://www.comepp.it/Macchine_lavorazione_marmo/Macchine_lavorazione_marm o_granito.htm

Glossmetria

http://www.fkv2.com/linee2/zehntner2/spec_zh/gloss.pdf http://www.fkv.it/index2.php?area=rappresentate&linea=ZH&prod=glossmetri http://www.strumentieservizi.it/prodotti_el.asp?scat=1&cat=13 http://www.geplastics.com/resins/it/devprod/opticalt.html http://www.salmoiraghistrumenti.it/strumenti/strumenti-modelli/34300245.html http://www.montagnalab.com/b5.htm http://www.zygo.com/ http://www.geass.com/html/glossmetri.htm http://www.warwickmassa.com/cgi-bin/prod.cgi?prodname=DR%20LANGE%20-%20GLOSSMETRI http://www.lab2000.com/lab04-96/GUI04-96.TXT http://www.ien.it/ar/ar/ft_i.html

Norme

http://www.uni.com/it/ http://www.qec.it/articoli/articoli_home.asp?IDInfo=82764

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BIBLIOGRAFIA 83 http://www.ariostea.it/qualitatotale/caratteristiche_tecniche.php/it

Grandezze fotometriche

http://brezza.iuav.it/dpa/ricerche/trevisan/cad2000/render/render5/Rendering_05.ht m http://www.soundlite.it/articoli/2000/set00/illscena_p2.html http://www.themeter.net/elettromagnetiche.htm http://www.uni.com/it/ http://www.qec.it/articoli/articoli_home.asp?IDInfo=82764

Varie

http://www.lot-oriel.com/site/pages_it_it/home/home/home.php http://www.ino.it/UNI3/2it.htm http://biblioteca.comune.massa.ms.it/biblioteche/marmi.html

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