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Nuclear Inst. and Methods in Physics Research, A 978 (2020) 164375

Contents lists available at ScienceDirect

Nuclear Inst. and Methods in Physics Research, A

journal homepage: www.elsevier.com/locate/nima

State-of-the-art and evolution of UFSD sensors design at FBK

R. Arcidiacono

b,a,∗

, G. Borghi

f,g

, M. Boscardin

f,g

, N. Cartiglia

a

, M. Costa

d

, G.F. Dalla Betta

e,f

,

F. Fausti

a

, M. Ferrero

b

, F. Ficorella

f,g

, M. Mandurrino

a

, S.M. Mazza

c

, E.J. Olave

a

, L. Pancheri

e,f

,

G. Paternoster

f,g

, H.-F.W. Sadrozinski

c

, V. Sola

a,d

, A. Staiano

a

, A. Seiden

c

, F. Siviero

d

,

M. Tornago

d

, Y. Zhao

c

aINFN, Torino, Italy

bUniversità del Piemonte Orientale, Italy

cSCIPP, University of California Santa Cruz, CA, USA dUniversità di Torino, Torino, Italy

eUniversità di Trento, Trento, Italy fTIFPA INFN Trento, Trento, Italy gFondazione Bruno Kessler, Trento, Italy

A R T I C L E I N F O

Keywords: Silicon sensor Fast timing Low gain Charge multiplication LGAD

A B S T R A C T

In the past few years, there has been growing interest in the development of silicon sensors able to simultaneously measure accurately the time of passage and the position of impinging charged particles. In this contribution, a review of the progresses in the design of UFSD (Ultra-Fast Silicon Detectors) sensors, manufactured at the FBK (Fondazione Bruno Kessler) Foundry, aiming at tracking charged particles in 4 dimensions, is presented. The state-of-the-art UFSD sensors, with excellent timing capability, are planned to be used in both ATLAS and CMS experiments detector upgrade, in order to reduce the background due to the presence of overlapping events in the same bunch crossing.

The latest results on sensors characterization including time resolution, radiation resistance and uniformity

R. Arcidiacono

G. Borghi

M. Boscardin

N. Cartiglia

M. Costa

G.F. Dalla Betta

F. Fausti

M. Ferrero

F. Ficorella

M. Mandurrino

S.M. Mazza

E.J. Olave

L. Pancheri

G. Paternoster

H.-F.W. Sadrozinski

V. Sola

A. Staiano

A. Seiden

F. Siviero

M. Tornago

Y. Zhao

1 / 6

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