SUPPORTING INFORMATION
Control of Functionalization of Supports for Subsequent
Assembly of Titania Nanoparticle Films
Steffi Rades1, Patrizia Borghet2, Erik Ortel1, Thomas Wirth1, Miren Blanco3, Estíbaliz Gómez3, Amaia
Martinez3, Jacques Jupille2, Gianmario Martra4 and Vasile-Dan Hodoroaba1,* 1 Federal Institute for Materials Research and Testing (BAM), Berlin, Germany 2 Université Pierre et Marie Curie (UPMC), Paris, France
3 IK4-TEKNIKER, Eibar, Spain 4 University of Torino, Torino, Italy
*Correspondence
Vasile-Dan Hodoroaba, Federal Institute for Materials Research and Testing (BAM), 12200 Berlin, Germany. Email: dan.hodoroaba@bam.de
FIGURE S0 Photographs with the selected substrates (from left to right): silica glass, Ti alloy, and conductive (FTO) glass.
FIGURE S1 Strategy for functionalization of silica glass supports. Potential molecular fragments to be monitored with ToF-SIMS are marked with red.
FIGURE S2 Strategy for functionalization of the titanium alloy supports. Potential molecular fragments to be monitored with ToF-SIMS are marked with red.
FIGURE S3 Wide scan XPS spectra of the functionalized conductive glass substrates (with APTS in red, and with GA in green).
FIGURE S4 Overview Auger electron spectrum of the APPA functionalized Ti alloy substrate together with the micrograph having marked the measurement area.
